İndekslere Göre Yayın Sayıları
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SCI-E
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TR Dizin
Makale Bilgileri
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Annealing effect on the electrical properties of HfO2 based Schottky barrier diodes, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 16(3), 2014 SCI / SCI EXPANDED
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ELECTRICAL CHARACTERISTICS OF Au/n-Si STRUCTURE WITH AND WITHOUT Bi3Ti4O12 INTERFACIAL LAYER
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Analysis of the electrical characteristics of Al/ GaN/ p-GaAs Structure at high temperatures
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On the Negative Capacitance Behaviour at Low Frequencies in Au/ITO-PVP/ n-Si Structures
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The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device
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Capacitance - voltage and Conductance - voltage Characteristics of Au/ C20H12/n-Si Structure at high temperatures
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Electrical characteristics of Au/n-Si structure with perylene interfacial layer at room temperature
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The profile of frequency dependent interface states (Nss) and series resistance (Rs) in Au/C20H12/n-Si (MPS) Schottky diodes
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Journal of Materials Science: Materials in Electronics
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Journal of Materials Science: Materials in Electronics
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ISARC Bilim ve Danışma Kurulu Üyeliği
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ISARC Düzenleme Kurulu Üyeliği