| 1
ELECTRICAL CHARACTERISTICS OF Au/n-Si STRUCTURE WITH AND WITHOUT Bi3Ti4O12 INTERFACIAL LAYER, 8. INTERNATIONAL GÖBEKLİTEPE SCIENTIFIC STUDIES CONGRESS, 02.03.2024
Doç. Dr. Seda Bengi |
| 2
Analysis of the electrical characteristics of Al/ GaN/ p-GaAs Structure at high temperatures, 9th International Conference on Materials Science and Nanotechnology for Next Generation, 22.09.2022
Doç. Dr. Seda Bengi, Doç. Dr. Sedat Zeyrek |
| 3
On the Negative Capacitance Behaviour at Low Frequencies in Au/ITO-PVP/ n-Si Structures, 8th International Conference on Materials Science and Nanotechnology For Next Generation (MSNG-2021), 14.06.2021
Doç. Dr. Seda Bengi |
| 4
The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device, 5th International Conference on Materials Science and Nanotechnology for Next Generation, 04.10.2018
Esra Yükseltürk, Doç. Dr. Seda Bengi, Mehmet Mahir Bülbül |
| 5
Capacitance - voltage and Conductance - voltage Characteristics of Au/ C20H12/n-Si Structure at high temperatures, 2nd International Conference on Innovations in Natural Science and Engineering, 07.09.2018
Doç. Dr. Seda Bengi, Esra Yükseltürk, Mehmet Mahir Bülbül |
| 6
Electrical characteristics of Au/n-Si structure with perylene interfacial layer at room temperature, 5th International Conference on Materials Science and Nanotechnology for Next Generation, 04.06.2018
Doç. Dr. Seda Bengi, Mehmet Mahir Bülbül |
| 7
The profile of frequency dependent interface states (Nss) and series resistance (Rs) in Au/C20H12/n-Si (MPS) Schottky diodes, 4th International Conference on Materials Science and Nanotechnology for Next Generation, 28.06.2017
Doç. Dr. Seda Bengi |
| 1 Journal of Materials Science: Materials in Electronics, Hakem, 2025 |
| 2 Journal of Materials Science: Materials in Electronics, Hakem, 2025 |
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GENEL FİZİK I |
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TEMEL ELEKTRİK VE ELEKTRONİK |
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ALTERNATİF AKIM DEVRE ANALİZİ |
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GENEL FİZİK II |
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ISARC Bilim ve Danışma Kurulu Üyeliği Üyelik |
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ISARC Düzenleme Kurulu Üyeliği Üyelik |